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<p class="MsoNormal">Dear Colleague, <o:p></o:p></p>
<p class="MsoNormal"><o:p> </o:p></p>
<p class="MsoNormal">This is a reminder for the <a href="https://diamonddday.com/">
Diamond D-Day</a>, a one-day international workshop on the latest development on GaN-on-Diamond materials and devices, a next generation of GaN for ultra-high power RF users. The International Workshop will be held at the Bristol Royal Marriott, in Bristol
in the United Kingdom on the 29th of January, 2019. <o:p></o:p></p>
<p class="MsoNormal"><o:p> </o:p></p>
<p class="MsoNormal">It is free of charge to attend but registration is mandatory (see website for registration). Spaces are limited and if you are interested in attending, we strongly suggest you to register by latest Friday 18<sup>th</sup> January; after
this date further places will be assigned via a wait list.<o:p></o:p></p>
<p class="MsoNormal"><o:p> </o:p></p>
<p class="MsoNormal">Invited speakers presenting their latest results include<o:p></o:p></p>
<ul style="margin-top:0cm" type="disc">
<li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Avram Bar-Cohen (Raytheon, USA)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Andy Barnes (ESA - European Space Agency, UK)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Volker Cimalla (IAF - Fraunhofer Institute for Applied Solid State Physics, Germany)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Daniel Francis (Akash Systems, USA)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Daniel Hou (GCS - Global Communication Semiconductors, USA)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Jose Jimenez (Qorvo, USA)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Martin Kuball (University of Bristol, UK)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Erich Neubauer (RHP Technology, Austria)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Won Sang Lee (RFHIC, South Korea/USA)<o:p></o:p></li><li class="MsoListParagraph" style="margin-left:0cm;mso-list:l0 level1 lfo1">Oliver Williams (Cardiff University, UK)<o:p></o:p></li></ul>
<p class="MsoNormal"><o:p> </o:p></p>
<p class="MsoNormal">Best regards<o:p></o:p></p>
<p class="MsoNormal">Martin<o:p></o:p></p>
<p class="MsoNormal"><o:p> </o:p></p>
<p class="MsoNormal">---<o:p></o:p></p>
<p class="MsoNormal">Prof. Martin Kuball<o:p></o:p></p>
<p class="MsoNormal">Center for Device Thermography and Reliability<o:p></o:p></p>
<p class="MsoNormal">University of Bristol<o:p></o:p></p>
<p class="MsoNormal">United Kingdom<o:p></o:p></p>
<p class="MsoNormal">Ph: +44 (0)117 928 8734<o:p></o:p></p>
<p class="MsoNormal">Email: Martin.Kuball@bristol.ac.uk<o:p></o:p></p>
<p class="MsoNormal"><o:p> </o:p></p>
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