 | G.Naresh-Kumar, B.Hourahine, P.R.Edwards, A.P.Day, A.Winkelmann, A.J.Wilkinson, P.J.Parbrook, G.England and C.Trager-Cowan (2012)
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope
Physical Review Letters 108 135503
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| C.Trager-Cowan, F.Sweeney, P.W.Trimby, A.P.Day, A.Gholinia, N.H.Schmidt, P.J.Parbrook, A.J.Wilkinson and I.M.Watson (2007)
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
Physical Review B: Condensed Matter 75 085301
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| S.Pereira, M.R.Correia, E.Pereira, K.P.O'Donnell, C.Trager-Cowan, F.Sweeney and E.Alves (2001)
Compositional pulling effects in InxGa1-xN/GaN layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study
Physical Review B: Condensed Matter 64 205311
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| K.Lorenz, I.S.Roqan, N.Franco, K.P.O'Donnell, V.Darakchieva, E.Alves, C.Trager-Cowan, R.W.Martin, D.J.As and M.Panfilova (2009)
Europium doping of zincblende GaN by ion implantation
Journal of Applied Physics 105 113507
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| C.Trager-Cowan, F.Sweeney, J.Hastie, S.K.Manson-Smith, D.A.Cowan, D.McColl, A.Mohammed, K.P.O'Donnell, D.Zubia, S.D.Hersee, C.T.Foxon, I.Harrison and S.V.Novikov (2002)
Characterization of nitride thin films by electron backscatter diffraction
Journal of Microscopy 205 226-230
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| A.Winkelmann, C.Trager-Cowan, F.Sweeney, A.P.Day and P.Parbrook (2007)
Many-beam dynamical simulation of electron backscatter diffraction patterns
Ultramicroscopy 107 414-421
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| S.K.Manson-Smith, C.Trager-Cowan and K.P.O'Donnell (2001)
Scanning tunneling luminescence studies of nitride semiconductor thin films under ambient conditions
physica status solidi (b) 228 445-448
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| C.Trager-Cowan, F.Sweeney, A.Winkelmann, A.J.Wilkinson, P.W.Trimby, A.P.Day, A.Gholinia, N.-H.Schmidt and P.J.Parbrook and I.M.Watson (2006)
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
Materials Science and Technology 22 1352-1358
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| C.Trager-Cowan, F.Sweeney, A.J.Wilkinson, I.M.Watson, P.G.Middleton, K.P.O'Donnell, D.Zubia, S.D.Hersee, S.Einfeldt and D.Hommel (2002)
Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
physica status solidi (c) 0 532-536
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